Effect of triple junctions on deformation twinning in a nanostructured Cu–Zn alloy: A statistical study using transmission Kikuchi diffraction

• Silu Liu,
• Xiaolong Ma,
• Lingzhen Li,
• Liwen Zhang,
• Patrick W. Trimby,
• Xiaozhou Liao,
• Yusheng Li,
• Yonghao Zhao and
• Yuntian Zhu

Beilstein J. Nanotechnol. 2016, 7, 1501–1506, doi:10.3762/bjnano.7.143

• , Australia 10.3762/bjnano.7.143 Abstract Scanning electron microscopy transmission Kikuchi diffraction is able to identify twins in nanocrystalline material, regardless of their crystallographic orientation. In this study, it was employed to characterize deformation twins in Cu/10 wt % Zn processed by high

• nanoscale twins thinner than its step size. Keywords: nanocrystalline materials; transmission Kikuchi diffraction; triple junctions; twins; Introduction The Hall–Petch relationship has inspired materials scientists to refine grains to increase the strength of materials since the early 1950s [1][2][3

• electron microscope (SEM) to collect transmission Kikuchi diffraction (TKD) patterns from sub-10-nm domains in an electron transparent sample [28][30][31]. Like conventional EBSD, TKD can measure grain size, morphology, phase distribution and crystalline lattice orientation. However, the biggest advantage